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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (311.632 KB) | DOI: 10.26740/jpte.v9n03.p575-583
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (152.42 KB) | DOI: 10.26740/jpte.v9n03.p639-645
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (729.972 KB) | DOI: 10.26740/jpte.v9n03.p669-674
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1000.084 KB) | DOI: 10.26740/jpte.v9n03.p723-730
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (185.933 KB) | DOI: 10.26740/jpte.v10n01.p27-34
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (410.38 KB) | DOI: 10.26740/jpte.v10n01.p51-55
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (597.164 KB) | DOI: 10.26740/jpte.v10n03.p11-18
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1041.795 KB) | DOI: 10.26740/jpte.v10n03.p357-365
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35475/riptek.v19i1.294
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.29103/ijevs.v1i6.1635