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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2015.v19i2.9
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15575/jpi.v6i1.6443
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.iptek.2015.v19i2.9