Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56799/peshum.v2i6.2378
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/jk.v1i3.46949
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v5i3.86723
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56799/peshum.v5i3.15195
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35877/454RI.daengku4488
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35877/454RI.daengku4490
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55606/jurdikbud.v5i3.8623