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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.23969/jp.v10i04.36344
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31602/rjpo.v8i2.21151
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31602/rjpo.v8i2.21150
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/cjpko.v15i3.55409
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v5i3.86588