Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37385/jaets.v5i1.1997
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52759/inventory.v4i2.134
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24853/jpmt.5.2.104-109
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.51804/jiso.v6i2.102-109
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2023.v7i2.5017
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24853/jurtek.16.2.213-224
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.adipati.2022.v1i2.3178
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.adipati.2023.v2i1.3849
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (347.88 KB) | DOI: 10.55732/jrt.v2i2.228
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55732/jrt.v6i2.354