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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i2.594
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i2.596
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i2.601
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i3.605
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i3.607
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i3.608
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i3.613
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i4.618
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v1i4.637
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.35793/jtek.v2i1.919