Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (575.688 KB) | DOI: 10.23887/jstundiksha.v11i2.45319
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281/zenodo.11294759
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281/zenodo.14286365
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (222.412 KB) | DOI: 10.21831/elinvo.v2i1.16416
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/jiptek.v17i1.81706
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/jiptek.v13i2.45624
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v7i2.81703
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v7i1.68000
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (520.666 KB) | DOI: 10.20961/ijie.v2i2.12598
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20961/ijie.v6i1.58168