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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (291.985 KB) | DOI: 10.32528/pengabdian_iptek.v4i2.1841
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (291.985 KB) | DOI: 10.32528/pengabdian_iptek.v4i2.1841
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31967/relasi.v16i0.61
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31967/relasi.v12i1.90
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30998/jabe.v6i3.5336
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30998/jabe.v6i3.5336
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30998/jabe.v7i1.6997
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (725.73 KB) | DOI: 10.31967/mba.v3i1.355
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31967/mba.v3i2.361
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31967/mba.v5i1.551