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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55338/saintek.v6i1.3226
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55338/saintek.v6i1.3235
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55583/jkip.v4i2.872
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55583/jkip.v4i2.873
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55583/jkip.v4i2.874
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55583/jkip.v4i2.878
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55583/jkip.v4i2.880
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52622/jam.v2i2.214
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37249/jpma.v4i2.835
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.69820/jole.v1i2.65