Journal : Bulletin of Electrical Engineering and Informatics
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v11i6.4854
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i2.4855
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v11i6.4856
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i3.4704
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i4.5072
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i4.4700
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i5.4097
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v13i2.6088
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i6.6150
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v12i6.6513
