Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.19184/ikesma.v15i2.14156
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2024.v8i1.5349
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30822/berbakti.v2i2.3607
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30822/berbakti.v2i2.3683
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20473/mgk.v12i1.2023.8-14
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20473/mgk.v12i2.2023.1117-1124
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59837/scgg2d13
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32763/xr626k80
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30822/berbakti.v2i3.3870
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281/zenodo.14725846