Journal : Bulletin of Electrical Engineering and Informatics
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (631.684 KB) | DOI: 10.11591/eei.v8i4.1552
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (388.1 KB) | DOI: 10.11591/eei.v9i1.1616
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (723.905 KB) | DOI: 10.11591/eei.v8i4.1344
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v10i6.3283
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v7i4.674
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v9i6.2319
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v10i6.3135
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (883.967 KB) | DOI: 10.11591/eei.v9i2.1653
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (508.262 KB) | DOI: 10.11591/eei.v8i2.1263
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.11591/eei.v10i1.2662
