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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281/zenodo.10642624
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281/zenodo.10418607
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54373/imeij.v5i5.1918
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54373/imeij.v5i5.1927
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54373/imeij.v5i6.2047
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54373/imeij.v5i6.2074
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.54373/imeij.v5i6.2311
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/iptek.v3i3.64581
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56799/jceki.v5i1.11935