Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33649/padaidi.v1i2.516
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33649/padaidi.v1i2.516
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.56489/fik.v7i1.352
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31850/jmosfet.v3i2.2611
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (212.256 KB) | DOI: 10.33477/bs.v10i2.2194
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/jpk.30.2.188-193
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/jpk.30.2.162-167
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/riggs.v4i2.1689