Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33394/jk.v10i4.12896
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.53515/aijpkm.v5i2.200
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26418/jppk.v12i3.64218
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26418/jppk.v12i1.61474
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26418/jppk.v12i7.62742
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26418/jppk.v12i11.71883
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26418/jppk.v11i12.60777
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15408/ref.v4i2.44849
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2022.v6i2.3595