Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33394/jp.v11i4.13185
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58169/saintek.v3i2.666
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59422/rjmss.v1i12.690
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26418/jppk.v12i6.66835
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59395/jitp.v4i2.98
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.65353/am0cs595
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.65353/7wqxyn27
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.30872/jbssb.v9i1.18521
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.17509/wapfi.v10i1.80315