Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.17358/ijbe.11.1.171
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/jpk.30.1.48-54
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/jpk.30.1.40-47
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31258/jpk.30.1.48-54
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.69959/nujess.v2i1.87
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31604/jpm.v7i8.3054-3073
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52103/jahr.v6i2.2016
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32939/ishlah.v5i2.247
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2022.v6i2.2148