Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.62567/jpi.v1i2.760
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47398/iltek.v20i02.252
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.22146/bkm.v41i11.23604
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.61306/jnastek.v5i4.326
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24252/instek.v10i2.57438
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33369/jsn.11.2.202-219
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.62281/rmsse591
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.5281/zenodo.18147188
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.59903/ebussiness.v5i2.229
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31599/krtha.v19i3.4548