Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/jptam.v4i2.552
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/jptam.v5i3.2050
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/jptam.v6i1.3212
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/jptam.v7i2.7730
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31004/jptam.v7i3.10621
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37476/nmar.v4i4.4583
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31849/digitalzone.v14i2.17106
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.52491/at.v8i2.67
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.58169/jpmsaintek.v2i1.110